Future Transistors
Scanning electron micrograph of cross-sectioned NMOS transistor.
One solution is to use other materials, particularly metal compounds of hafnium, zirconium and aluminum, for insulating layers, or "gate stacks." Due to their high dielectric constants, or k-values, gates of "high-k" materials can be made much thicker than those of SiO2, while achieving the same gate capacitance (with capacitance proportional to the stored electrical charge that turns a gate on and off). The AMRC is working with SEMATECH to pursue this high-k option, identifying materials and processes in time to meet industry manufacturing needs.
Other future-transistor issues being addressed by the AMRC include:
- Novel transistors using new fabrication approaches, such as strained silicon, silicon-on-insulator (SOI), and nanotechnology
- Investigation of new gate stack materials through computer modeling
- Advanced organic/silicon devices for chemical sensing and biosensing
